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 Category: Vendors, Organizations & Universities: Vendors: Wednesday, June 19, 2013
Atrenta, Inc.  
Address: 2077 Gateway Place, Suite 300
              San Jose, CA 95110 USA
Phone: 408-453-3333
Email: moreinfo@atrenta.com
Website: www.atrenta.com


Atrenta is a provider of broad-based design analysis solutions based on industry standard SpyGlass technology. Atrenta’s design analysis tools deliver early design closure by eliminating downstream design problems and iterative discoveries. This transforms design closure from a set of disjoint events late in implementation stage to a continuous process jumpstarted early in RTL design phase. This leads to improved predictability and efficiency in SoC design phases including RTL design, IP reuse, Verification, logical and physical Implementation. Atrenta has over 100 customers including the world's top 10 semiconductor companies.

SOCcentral Feature Articles

Vendor-Independent RTL Memory BIST Insertion and Verification

10/23/2012

Understanding Formal Verification Concepts-Part 3

1/31/2012

Understanding Formal Verification Concepts-Part 2

1/16/2012

Understanding Formal Verification Concepts

12/9/2011

Handling Clock Synchronization During Power-Driven Synthesis

10/27/2011

Articles Online

Guidelines for Early Power Analysis

2/11/2013

Seismic Shifts Await EDA in a More-than-Moore World

12/20/2012

Power Awareness in RTL Design Analysis

7/23/2012

A Practical Approach to IP Quality Inspection

9/26/2011

Facilitating At-Speed Test at RTL: Part 2

4/20/2011

Facilitating At-Speed Test at RTL: Part 1

4/12/2011

SOC DFT Verification With Static Analysis and Formal Methods

11/17/2010

Will IP Use Increase In Forthcoming SOC Design?

11/4/2010

Design Quality and Its Impact On Design Closure

7/30/2010

Power Analysis of Clock Gating at RTL

6/17/2010

Verification and Generation of Constraints

8/13/2009

Changing SoC Design Methodologies to Automate IP Integration and Reuse

7/27/2009

Preserving the Intent of Timing Constraints

5/17/2008

Critical Clock-Domain-Crossing Bugs

4/2/2008

Understanding Clock Domain Crossing Issues

12/24/2007

Timing Constraints Generation Technology

5/17/2007

New EDA Tools Improve Low Power Design

2/19/2007

Solving the Toughest Problems in CDC Analysis

8/28/2006

A Systematic Approach to Verifying FSMs

10/27/2005

Reducing False Errors in Clock-Domain Crossing Analysis

1/17/2005

Tackling Multiple Clocks in SoCs

3/17/2004

Moving DFT to RTL Overcomes Test Vector Issues

3/3/2003

Tutorials, White Papers, etc.

Assertion-Based Verification: Choosing the Right Solution

Combining Structural and Functional Verification Techniques to Improve Effective CDC Verification

EDA Tools

1Team:Implement

Design Suites

1Team:Verify

Formal Verification

1Team:Analyze Predictive Analysis

Functional Verification

News

Atrenta Ships 5.1 Release of SpyGlass Platform

6/10/2013

Atrenta and Mentor Collaborate on SOC Power Sign-off

5/30/2013

Atrenta India Announces New R&D Facility in Noida

5/13/2013

frobas Chooses SpyGlass CDC for SOC Design Flow

4/22/2013

IPextreme Announces Atrenta as First EDA Company to Join Constellations

1/9/2013

Atrenta Ships 5.0 Release of SpyGlass Platform

12/4/2012

Atrenta and TSMC Announce SpyGlass IP Kit 2.0 Availability

10/30/2012

Atrenta Acquires NextOp Software

6/20/2012

Atrenta Introduces Fast Lint for SpyGlass

6/4/2012

Atrenta Ships 4.7 Release of SpyGlass Platform

5/2/2012

Atrenta Offers IP Kit Spring-Cleaning Promotion

4/16/2012

Atrenta and TSMC IP Quality Initiative Gains Broad Industry Acceptance

3/5/2012

Atrenta Joins Cadence System Realization Alliance

10/24/2011

Atrenta SpyGlass Used in TSMC Soft IP Qualification Flow

5/26/2011

Atrenta, Cadence and SpringSoft Sponsor Free Exhibits Floor Passes and "I LOVE DAC" Campaign

5/26/2011

imec and Atrenta Develop Exploration Flows for 3D ICs

5/25/2011

STARC Adopts Atrenta's Advanced RTL Power and Deep Submicron Test Solutions

5/19/2011

Atrenta's SpyGlass 4.5 Release Adds Numerous New Features

5/16/2011

Atrenta and CEA-Leti Sign a Multi-Year Collaboration Agreement

10/27/2010

Atrenta and TSMC Develop Soft IP Qualification Flow

10/25/2010

Atrenta Announces SpyGlass-Physical for Early Implementation Analysis

6/17/2010

Atrenta's SpyGlass-CDC Solution Reduces Design Risk for Fujitsu Microelectronics Europe

6/2/2010

Arasan Joins Atrenta's SpyLinks Partner Program

2/17/2010

STARC Collaborates with Atrenta on EDA Tool Quality Management System

2/1/2010

NEC Electronics Adopts Atrenta SpyGlass for Early Testability and Low-Power Design

1/25/2010

Atrenta SpyGlass-Constraints SDC Equivalence Verification Capability Adopted By STARC

12/2/2009

Atrenta's SpyGlass-CDC Solution Boosts IP Integration Efficiency for Fujitsu Kyushu Network Technologies

11/17/2009

Atrenta Announces Major Extensions to 1Team-Genesis Platform

7/31/2009

Atrenta and Mentor Graphics Collaborate on Power Optimization for High-Level Synthesis

7/14/2009

Atrenta Collaborates with Sonics and Denali on a 1Team-Genesis Reference Flow to Accelerate SOC Assembly

7/8/2009

Atrenta SpyGlass-MBIST Adopted by STMicroelectronics for RTL Memory BIST and Repair Insertion

6/12/2009

DS2 Adopts Atrenta SpyGlass for Advanced ASIC Design

3/2/2009

Tieto Joins Atrenta's SpyLinks Partner Program

2/25/2009

Atrenta's SpyGlass-CDC Solution Boosts IP Integration Efficiency for Atheros

2/10/2009

Atrenta Announces "SpyGlass Clean" Flow with Leading ESL Synthesis Providers

11/10/2008

Tensilica Joins Atrenta's SpyLinks Partner Program

9/30/2008

Socle Adopts Atrenta’s SpyGlass-DFT Product

9/3/2008

Atrenta Announces 1Team-Genesis Product and Collaboration with STMicroelectronics

6/9/2008

Atrenta Unveils GuideWare Methodologies to Accelerate Adoption of Its Early Design Closure Solutions

6/9/2008

Atrenta Announces SpyLinks Alliance Program

5/28/2008

STARC Adds Atrenta Tools to Reference Flow

4/24/2008

PLX Technology Embraces SpyGlass-CDC for RTL Sign-off

4/16/2008

Atrenta Announces Design-for-Test Solution for Deep Submicron Circuits

3/10/2008

TES Electronic Solutions Standardizes on Atrenta's SpyGlass Design Analysis Platform

4/30/2007

Atrenta Gains Key Patents for Chip Design Analysis Technologies

2/22/2007

Atrenta Donates Low Power Constraint Format to Accellera

11/8/2006

Cray Adopts Atrenta's SpyGlass Platform for Next Generation ASIC Projects

10/31/2006

Atrenta Secures $16M in Series D Funding

10/19/2006

STMicroelectronics Turns to Atrenta for Its Early Design Closure Solution

7/21/2006

Atrenta Introduces Comprehensive C/C++ Analysis for Embedded Software Design

6/13/2005

Atrenta Introduces Predictive Analysis Solution, Providing Earlier, Better Optimization of Chip Designs

5/4/2005

Atrenta Predictive Development Solutions Reduce Risk, Boost Innovation

4/4/2005

Atrenta Releases 1Team Implement to Improves RTL Prototyping, Design and Floorplanning

4/4/2005

TSMC Selects Atrenta as Reference Flow 5.0 Partner for Power Closure and IC Integration Flows

6/7/2004

Atrenta Teams Up With VSI Alliance to Develop an Automated Method to Validate IP Quality

5/10/2004

Atrenta Selects Transfer Nederland as Distributor in BeNeLux Region

2/12/2004

Toshiba Japan Selects Atrenta's SpyGlass to Identify Critical Design Problems at RTL

2/4/2004


Go directly to Atrenta, Inc. for more company and product information.

Keywords: Atrenta, EDA, Design Entry and/or Analysis (RTL), Design Debug (RTL), DFT (RTL), Formal Analysis (RTL), Power Analysis & Optimization (RTL), Synthesis (RTL), Layout (ASIC),
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