October 24, 2007 -- Engineers and scientists face many difficulties when characterizing advanced semiconductor processes. Measurement challenges such as making parallel measurements, improving QSCV and MFCV measurement accuracy and preventing inadvertent device damage (to name just a few) are not adequately addressed by previous measurement solutions. In addition, these challenges are set against the backdrop of an ongoing need to reduce test costs. In this webcast you will learn some powerful new solutions that can help to solve these and other issues, and that can also provide improved flexibility, accuracy, and ease-of-use. You will also learn how to optimize cost versus performance by tailoring the solutions shown to meet your exact measurement needs.

Go directly to the EE Times Education & Training webcast site to view this presentation. Registration may be required.