| RF Measurements for LTE Featured |
Sponsor: Agilent Technologies, Inc. | Webcast Date: 8/7/2008 | August 7, 2008 -- This webcast explains measurement and troubleshooting techniques for both uplink and downlink LTE physical layer signals. We'll review the LTE physical layer structure before discussing key measurement approaches for modulation ... read more |
| Understanding and Applying Integrated Inertial MEMs Technology Featured |
Sponsor: Analog Devices, Inc. (ADI) | Webcast Date: 7/23/2008 | July 23, 2008 -- In this seminar you'll learn how, and why, integrated MEM's sensors work to detect motion, acceleration, incline, and rotation. You'll also learn how to apply them to obtain accurate measurements in up to six degrees of freedom, ... read more |
| Analog Interfacing with Sensors for Embedded Systems Featured |
Sponsor: Cypress Semiconductor Corp. | Webcast Date: 7/16/2008 | July 16, 2008 -- The use of sensors in embedded applications has become widespread and is growing rapidly. Systems from industrial automation to medical to consumer devices utilize sensors for fundamental measurements in basic control loops and ... read more |
| Nonlinear Vector Network Analyzer Applications Featured |
Sponsor: Agilent Technologies, Inc. | Webcast Date: 7/16/2008 | July 16, 2008 -- This webcast will present Agilent's new Nonlinear Vector Network Analyzer measurement capability. A simple measurement configuration, calibration process and new phase calibration module provide vector corrected nonlinear measur ... read more |
| Building a VMM-Based Constrained Random Environment for Bus Protocol Verification Featured |
Sponsor: Synopsys, Inc. | Webcast Date: 7/15/2008 | July 15, 2008 -- The continuing trend for larger, more complex designs has made it more critical than ever for verification engineers to increase their productivity. One generally accepted solution to the productivity demand is to employ constra ... read more |
| Efficient FPGA Transceiver-Based Channel Modeling Using Agilent ADS Featured |
Sponsor: Agilent EEsof EDA | Webcast Date: 6/26/2008 | June 26, 2008 -- With FPGAs so commonly used in high-speed designs, signal integrity issues can be minimized by properly modeling the signal path. This presentation will model real world circuit boards using S-parameters, showing that it is poss ... read more |
| Applying A/D Converters in IF Sampling Architectures Featured |
Sponsor: Analog Devices, Inc. (ADI) | Webcast Date: 6/18/2008 | June 18, 2008 -- As high-speed A/D converter speed and performance have steadily increased over the years, direct IF-sampling has likewise become a key technique in the implementation of wideband digital receivers. By moving the converter "up" t ... read more |
| Hints for Getting the Most Out of Your Oscilloscope Featured |
Sponsor: Agilent Technologies, Inc. | Webcast Date: 6/12/2008 | June 12, 2008 -- Oscilloscopes have many features that most users don't use - not because they don't see the benefit, but because they're not well-publicized. If you own these scopes, you'll want to tune in to learn how to build your toolbox. If ... read more |
| Tips to Debug Common DDR 1/2/3 Physical and Protocol Layer Issues Featured |
Sponsor: Agilent Technologies, Inc. | Webcast Date: 6/5/2008 | June 5, 2008 -- The speed of DDR (Double Data Rate) memory technology has increased tremendously in the last few years. The latest DDR3 technology is operating at 1.6GTps and at the same time, the signal voltage has decreased to reduce power con ... read more |
| Driving High Performance ADCs in Communication Applications Featured |
Sponsor: Analog Devices, Inc. (ADI) | Webcast Date: 6/4/2008 | June 4, 2008 -- One of the major challenges in communications system design is successfully driving the desired signal into the ADC. Adequate fidelity for signal detection requires proper component selection and implementation of the interface. ... read more |
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