Page loading . . .

  
 Category: Magazine & Journal Articles Online: Article Archive 2005: Wednesday, May 22, 2013
Sort Entries by    
Use the input form on the right to search on a word or phrase.  
Page(s): 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 (160 Entries)
Manage Complexity in Nanometer SoC Designs  by Chip Design Magazine

June 1, 2005 -- The rapid increase in design complexity has become a serious limiting factor in nanometer system-on-a-chip (SoC) designs. This sharp increase is driven by two factors. One is the exponential rise in the number of devices integr ... read more

Start at the Top to Reduce Re-Spins for Analog-Digital Chips  by Synopsys, Inc. in Chip Design Magazine

June 1, 2005 -- Modern integrated-circuit design methodologies and advanced process technologies can produce complex mixed-signal devices. These devices, which are known as systems-on-a-chip (SoCs), feature a large number of digital, analog, a ... read more

Formal Approach Offers Verification "Salvation"  by Accellera in eeDesign (EE Times EDA News)

May 30, 2005 -- I once overheard a verification manager say, "What did I do to deserve this living hell?" Well, that is the point. It's often what we do or don't do in terms of a methodology that ultimately pulverizes our ivory tower view of t ... read more

Co-Design Links Chips, Boards and Packages  by Electronic Engineering Times (EE Times)

May 17, 2005 -- Chips, packages and boards have long been designed in isolation, but as silicon shrinks and complexity grows, the walls are coming down. Rising I/O counts and high-speed interfaces running up to 10 Gbits/second are prompting a ... read more

How FPGA Packaging Drives Signal Integrity  by Xilinx, Inc. in eeDesign (EE Times EDA News)

May 17, 2005 -- Until recently, signal integrity has been a concern relegated predominantly to multi-gigabit serial interface design. Today, it is an aspect of design that engineers building high-speed parallel interfaces like memory interface ... read more

Cosmic Radiation Comes to ASIC and SOC Design  by EDN Magazine

May 12, 2005 -- SEEs (single-event effects), such as soft errors, have since the early 1980s appeared in commercial electronics, but they are now becoming the dominant reliability-failure mechanism in modern CMOS technologies. Experts say that ... read more

Reliable Sign-off at Smaller Nodes  by Cadence Design Systems, Inc. in EDN Magazine

May 12, 2005 -- The demand for more functions and better performance continues to fuel the drive to more advanced process technologies. With each new technology generation, however, designers must deal with an increasing array of electrical an ... read more

A Guide to Better EMC for PC-Board Design  by Zuken, Ltd. in eeDesign (EE Times EDA News)

May 9,2005 -- Complicated RF and microwave theory is useful for designing radio equipment, but digital designers aim to avoid turning circuits into radios without the benefit of an RF engineering degree. In digital design, the number of possib ... read more

SoC Processing Options  by Texas Instruments, Inc. (TI) in Electronic Engineering Times (EE Times)

May 2, 2005 -- Systems-on-chip with multiple processing elements are an important part of the design landscape, especially for portable systems that require the high level of integration and the mixed data and signal processing that SoC device ... read more

The "Why" and "What" of Algorithmic Synthesis  by Mentor Graphics Corp. in eeDesign (EE Times EDA News)

May 2, 2005 -- Algorithmic synthesis helps hardware designers build and verify hardware more efficiently, giving them better control over optimization of their design architecture. The starting point of this flow is a subset of pure C++ that i ... read more




 Search for:
            Site       Current Category  
   Search Options

Subscribe to SOCcentral's
SOC Explorer
Newsletter
and receive news, article, whitepaper, and product updates bi-weekly.

Exec Viewpoint

Maximizing the Value of Your Internal IP


Warren Savage
CEO, IPextreme

Exec Viewpoint

Yes, Virginia,
There Is a
Stitch-and-Ship


Dave Johnson
VP of Sales
Breker Verification

Odd Parity

Lets' Go On
with the Show!


Mike Donlin
The Write Solution

Odd Parity Archive

Barbara's Bytes

So, Just What
Is ESL


Barbara Tuck
Senior Editor,
SOCcentral

SOCcentral Job Search

SOC Design
ASIC Design
ASIC Verification
FPGA Design
CPLD Design
PCB Design
DSP Design
RTOS Development
Digital Design

Analog Design
Mixed-Signal Design
DFT
DFM
IC Packaging
VHDL
Verilog
SystemC
SystemVerilog

Special Topics/Feature Articles
3D Integrated Circuits
Analog & Mixed-Signal Design
Design for Manufacturing
Design for Test
DSP in ASICs & FPGAs
ESL Design
Floorplanning & Layout
Formal Verification/OVM/UVM/VMM
Logic & Physical Synthesis
Low-Power Design
MEMS
On-Chip Interconnect
Selecting & Integrating IP
Signal Integrity
SystemC
SystemVerilog
Timing Analysis & Closure
Transaction Level Modeling (TLM)
Verilog
VHDL
 
Design Center
Whitepapers & App Notes
Live and Archived Webcasts
Newsletters


About SOCcentral.com

Sponsorship/Advertising Information

The Home Port  EDA/EDA Tools  FPGAs/PLDs/CPLDs  Intellectual Property  Electronic System Level Design  Special Topics/Feature Articles  Vendor & Organization Directory
News  Major RSS Feeds  Articles Online  Tutorials, White Papers, etc.  Webcasts  Online Resources  Software   Tech Books   Conferences & Seminars  About SOCcentral.com
Copyright 2003-2013  Tech Pro Communications   1209 Colts Circle    Lawrenceville, NJ 08648    Phone: 609-477-6308
184.563  0.40625