November 7, 2007 -- JTAG Technologies, Inc. has announced a USB version of its low-cost JT 3705 Explorer. The original parallel port Explorer was one of the first commercially-available boundary-scan controllers. The new USB-powered controller continues to deliver low cost and high reliability, meeting the requirements of design engineers, small-to-medium size enterprises, and low-volume contract electronic manufacturers.

The JT 3705/USB Explorer provides two fully-compliant boundary-scan Test Access Ports (TAPs). The TAPs can be synchronized for test purposes and are suitable for running a complete battery of board tests including IEEE 1149.1, 1149.4, and 1149.6 as well as PLD programming and low-volume flash programming. Test clock frequency is programmable up to 6MHz allowing very rapid test execution while TAP voltages can be set for a wide range of input and output characteristics.

The JT 3705/USB is powered from the USB interface for portability and use with the burgeoning laptop population. Furthermore, the JT 3705/USB is compatible with all JTAG Technologies' development tools such as JTAG ProVision and production packages such as the stand-alone package (PSA) and Production Integration Packages for LabVIEW, LabWindows, TestStand as well as C/C++ and Visual Basic.