April 18, 2008 -- ASSET InterTech, Inc. and Test Research, Inc. (TRI), a major provider of circuit board test and inspection equipment, have reached an agreement whereby ASSET’s ScanWorks technology will be integrated into TRI’s in-circuit test (ICT) systems. Integrating ScanWorks into TRI’s test platforms reduces test costs for equipment manufacturers because boundary-scan tests can be re-used throughout every phase of a product’s life cycle. For example, ScanWorks tests developed during design for design validation and prototype debug are portable and can be easily migrated to high-volume manufacturing test platforms such as TRI’s ICT systems. No additional investment in test development is needed.
"TRI has earned its reputation by providing manufacturers with maximum test coverage. Today, we are finding that physical access for test probes is disappearing and our customers are turning to non-intrusive test technologies like boundary scan," said Paul Lin, Vice President at TRI--ShenZhen. "It is strategically critical for TRI to ally ourselves with the best-in-class JTAG solution and that’s what led us to ASSET."
