| Rapid Debug of Serial Buses in FPGAs by EE Times Embedded |
June 30, 2009 -- Sub-megabit serial buses can be found in most embedded FPGA designs. Multi-gigabit serial bus inclusion in FPGAs is gaining traction. Serial buses' ease-of-implementation, low cost, and ties with legacy design blocks make them i ... read more |
| Balancing the Power Budget by Actel Corp. in Components in Electronics (CIE) |
June 30, 2009 -- Power has risen to the No. 1 or No. 2 concern in contemporary engineering surveys as more devices—from medical equipment to cell phones to portable music players—go mobile. The solution, until recently, was simple: select an app ... read more |
| Should Dual-Rail Go Mainstream in Deep Nanometer Era? by Virage Logic Corp. in Electronic Design Magazine |
June 29, 2009 -- Deep sub-nanometer designs are stressed with large process variability. SRAM-bits have the most aggressive design rules in the SOCs, and the most variability. A dual-rail solution offsets some of the variability at the cost of a ... read more |
| Match Multicore with Multiprogramming by Electronic Design Magazine |
June 25, 2009 -- Across the embedded landscape, the design credo has become "more cores." However, challenges remain when it comes to the software side. Some hardware architectures can deliver dozens of cores, while others hit thousands of cores ... read more |
| Little-Known Flash-Memory Features Protect Data and IP by Numonyx B.V. in EDN Magazine |
June 25, 2009 -- You design a system, and somebody messes it up. The damage is sometimes unintentional. For example, a service provider may install its software on your device and corrupt your original code. On the other hand, hackers and IP (in ... read more |
| The Dark Force of Evil in Electronics: Electromagnetic Interference by Electronic Design Magazine |
June 25, 2009 -- Is there an electronic product or circuit that’s not susceptible to electromagnetic interference (EMI)? For that matter, are any devices EMI-free? Simply put, no. EEs wish it wasn’t the case, of course, but it’s a fact of life i ... read more |
| SuperSpeed USB 3.0: Ubiquitous Interconnect for Next Generation Consumer Applications by Arasan Chip Systems, Inc. in Design & Reuse |
June 22, 2009 -- USB 2.0 has been firmly entrenched as a de-facto standard in the PC world for many years. USB 2.0 provides sufficient bandwidth for a variety of application devices connected directly or by hubs to a host computer. However, with ... read more |
| Managing an Adaptive Verification Environment with the Open Verification Methodology by STMicroelectronics in Design & Reuse |
June 22, 2009 -- Current and upcoming requirements to exhaustively verify a design under development can create significant challenges for verification, system and design engineers to quickly get from development to production. Further increasin ... read more |
| Examining the Case for Analog Automation by Electronic Engineering Times (EE Times) |
June 22, 2009 -- Complete automation of the analog IC design flow is a concept that has been debated for decades. With total automation still a distant goal, the EDA community has focused on automating elements of the design process, such as pla ... read more |
| Generic and Automatic Specman-based Verification Environment for Image Signal Processing IPs by STMicroelectronics in Design & Reuse |
June 18, 2009 -- In this article, we present a generic and automatic Specman-based verification environment for the verification of the image signal processing IPs. Specman-based coverage-driven random verification is very powerful methodology f ... read more |
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