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 Category: Magazine & Journal Articles Online: Article Archive 2012: Sunday, May 19, 2013
A Standards-Based Approach to Capacitive-Sensor EMC Problems  
Publication: EE Times Embedded
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April 4, 2012 -- By following basic principles based on industry standards, it is possible to implement capacitive sensing designs with high signal-to-noise ratios that will withstand a barrage of noisy abuse. This article looks at the most relevant EMC standards and noise threats, and discusses what can be done to ensure compliance for a given capacitive sensing application.

By J.D. van Wyk, M. Visser, and D.B. Rademeyer. (van Wyk is senior application and development engineer at Azoteq; Visser is responsible for all ESD testing, and collaborates narrowly with the IC design team at Azoteq; Rademeyer manages the applications group at the Paarl Development Centre.)

This brief introduction has been excerpted from the original copyrighted article.


View the entire article on the EE Times Embedded website.

Keywords: embedded system design, embedded systems, computer system design, general-purpose computers, special-purpose computers, EMC, electromagnetic interference, EMI, EE Times Embedded
602/38253 4/4/2012 249 58


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