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 Category: Magazine & Journal Articles Online: Article Archive 2012: Monday, May 20, 2013
Power Noise Reduction by Optimizing the Dynamic Power Signature of Digital ICs  
Publication: EE Times EDA Designline
Contributor: Teklatech
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July 30, 2012 -- Power noise integrity (PNI) is becoming a number one IC design focus, as product quality, circuit reliability and lifetime robustness are increasingly important parameters of strategic business value in high-volume IC products. All the while, higher levels of SOC integration, advanced low-power design techniques, increasing power density and faster circuit switching at scaling process nodes are causing critical PNI challenges at 28nm and beyond. Power delivery network (PDN) design is an increasingly complicated task, and key to semiconductor business success.

By Tobias Bjerregaard. (Bjerregaard is CEO and founder of Teklatech.)


This brief introduction has been excerpted from the original copyrighted article.


View the entire article on the EE Times EDA Designline website.

Read more about
Teklatech
on SOCcentral.com

Keywords: ASICs, ASIC design, EDA, EDA tools, electronic design automation, signal integrity, noise, power analysis, power optimization, EE Times EDA Designline, Teklatech
602/38978 7/30/2012 408 65


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