| Managing Variations in IC Physical Design Featured | Publication: eeDesign (EE Times EDA News) Contributor: Sierra Design Automation, Inc.
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October 24, 2005 -- At nanometer technologies, variability is
rapidly becoming one of the leading causes for chip failures and delayed
schedules. However, there is significant confusion about the term “variability”
in the design community today. Variability refers to the unpredictability,
inconsistency, unevenness, and changeability associated with a given nuance. For
nanometer design implementation flows, variability is associated with design
modes, environmental conditions, manufacturing steps, and device and
interconnect behavior.
In this article, we explore different forms of variation, review the
challenges involved in modeling variability and discuss the requirements of an
implementation system that comprehensively analyzes and optimizes variability.
By Shankar Krishnamoorthy. (Krishnamoorthy brings with
him over 13 years of experience in the EDA industry leading world-class
development teams. Prior to co-founding Sierra, Krishnamoorthy was at the helm
of the Physical Synthesis R&D organization at Synopsys, Inc.)
This brief introduction has been excerpted from the original copyrighted article.
View the entire article on the eeDesign (EE Times EDA News) website.
Read more about Sierra Design Automation, Inc. on SOCcentral.com |
| | Keywords: eeDesign, Sierra Design Automation, design for yield, DFY, design for manufacturing, DFM, EDA tools,
| | 563/16735 10/24/2005 10282 923 | |
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