January 22, 2007 -- Design for Yield (DFY) tools are expected to improve product yield. Design for Manufacturing (DFM) tools are expected to prevent yield loss. Speculation of the value of DFM or DFY technology can easily be delineated by simply validating simulated or predicted results using test data from wafer probe. In the absence of measured silicon the credibility of the DFM or DFY tools will be challenged. Therefore a common definition of product yield improvement metrics that are understood by test, manufacturing, design, and product engineers is the first step in design tools predicting product yield improvement. Once defined, tools to simulate or predict the expected silicon result can then use these metrics.
By Mark Rencher. (Rencher is President of Pivotal Enterprises.)
This brief introduction has been excerpted from the original copyrighted article.
Keywords: EE Times EDA Designline, Pivotal Enterprises, design for manufacturing, design-for-manufacturing, DFM, design for yield, design-for-yield, DFY, EDA tools,
