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Protect Your goal with Post-Silicon Formal Verification  
Publication: Design & Reuse
Contributor: Jasper Design Automation
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July 19, 2010 -- SOC designers are learning the benefits of applying high-capacity formal verification techniques at every stage of the design. Our formal tools are powerful and versatile enough for a wide variety of tasks such as architectural exploration and RTL verification, all the way through post-silicon debug.

A good rule of thumb to consider how costly a missed bug can be: Finding bugs in model testing is the least expensive option; if it's found in component test, add 10X to the cost; 10X more in system test; and another 10X if it makes it into production. You do the math. If you thought watching your team go down in the World Cup was depressing, try explaining to your boss how you let a bug loose in the field. Taking the analogy a bit further, using formal in the post-silicon lab is like having a really good goalie, because it's the only method for finding, fixing, and verifying the fix to shave untold engineering-hours from the design cycle, and maybe even save a job or two along the way.

Post-silicon debug means trying to reproduce bugs seen in the lab using directed-random-simulation and emulation, but often these traditional approaches, unlike formal, are unable to root cause the bug fast enough. Let's look at a fairly typical scenario.

Lawrence Loh. (Loh is with Jasper Design Automation.)

This brief introduction has been excerpted from the original copyrighted article.


View the entire article on the Design & Reuse website.

Read more about
Jasper Design Automation
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Keywords: ASICs, ASIC design, FPGAs, field programmable gate arrays, FPGA design, EDA, EDA tools, electronic design automation, formal verification, Design & Reuse, Jasper Design Automation,
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