November 4, 2011 -- ProPlus Design Solutions, Inc. has introduced a new product called NanoYield, developed to enable highly-efficient integrated circuit yield analysis and design optimizations, and is based on patented technology licensed from IBM.

The new product, which is part of the NanoDesigner circuit design platform, tackles the impact of increasing process variations at advanced process nodes. NanoYield provides an efficient way to estimate the product yield and guide the designer to achieve the optimal yield and performance trade-off. It builds on the foundation of the advanced variation-modeling components in the BSIMProPlus Spice modeling tool that extracts accurate statistical and corner models to enable accurate Monte Carlo and PVT analysis.

NanoYield is also powered by ProPlus's parallel statistical simulation engine which speeds any type of statistical simulations, including traditional Monte Carlo by 10X to 100X at full Spice accuracy. NanoYield further improves the statistical-simulation performance by incorporating advanced sampling technologies.

The technology ProPlus licensed from IBM is patented algorithms and methodologies for statistic sampling and yield calculation of static random access memory (SRAM) and many other applications. NanoYield delivers several orders of magnitude of speed-up over traditional Monte Carlo for high-sigma analysis and the simulation time can be cut from several months to several minutes. Technology development engineers can also use the solution to validate the process and improve the yield of SRAM and standard library cells.

"IBM is committed to licensing its intellectual property to encourage innovation and collaboration around the world," said Tom Reeves, Vice President of IBM, Business Development and Licensing. "Our technology licensing agreement with ProPlus provides a foundation for both companies to cooperate in providing better integrated circuit design solutions."

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