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SOCcentral Feature Articles
Development of Embedded DSP Communications Algorithms for Software Defined Radio	1/23/2008
When Probing Goes in the Chip	5/2/2005
Articles Online
Tracking Down Interference in Complex RF Environments	4/30/2013
Optimizing Memory Design	11/13/2012
Oscilloscope Memory Depth: When Bigger Is Not Always Better	3/7/2012
Managing Signal Integrity in Tomorrow's High-Speed Flash-Memory-System Designs	7/19/2011
Simulation Techniques Test Automotive Cluster Display ECUs	7/14/2011
A Mixed-Signal Approach to Debugging DDR DRAM Interfaces	12/14/2009
Test Choices for Improving PCI Express Reliability	6/1/2009
Driving the Convergence Between Fixed and Mobile Communications Into the Mainstream	3/5/2009
Eye-Diagram Analysis Speeds DDR SDRAM Validation	8/28/2008
A "How To" Tutorial on Logic Analyzer Basics for Digital Design	5/2/2007
Quickly Find Elusive Signal-Integrity Problems in High-Speed Designs	12/15/2006
Core-Aassisted Approach Accelerates Debug of FPGA DDR II Interfaces	6/21/2006
Spread-Spectrum Clocking: Measuring Accuracy and Depth	5/11/2006
RF Integration: Changing the Face of Test	10/11/2004
In-circuit SoC Verification Controls Costs	7/12/2004
Choosing the Right Strategy for SiP Testing	5/6/2004
Behavioral Modeling Smooths RF Design	9/26/2003
Verification of Third-Party CPU Intellectual Property	7/18/2003
Bandwidth Match Avoids I/O Snarl	3/3/2003

Webcasts
The Fundamentals of IV Measurement	4/10/2012
Digitizer Fundamentals: Design Considerations to Achieve Superior Measurements	3/21/2012
Learn to Analyze, Validate and Debug High Speed DDR3 Memory	10/4/2011
SuperSpeed USB 3.0 Validation and Compliance Testing Challenges	5/18/2011
High-Speed Interconnect Analysis and Compliance Testing	4/27/2011
Electronic Functional Test Best Practices	6/17/2010
PCI Express 3.0 Challenges and Agilent's Test Solutions	3/17/2010
PCI Express 3.0 Introduction and Key Design Challenges	2/17/2010
Conquering Noise for Accurate RF and Microwave Signal Measurements	10/29/2009
Addressing the Design and Verification Challenges of Cognitive Radio and SDR	10/7/2009
Making the Journey from WiMAX to LTE	9/24/2009
RFIC On-Chip Passive Modeling with EM (Electromagnetic) Simulation on Advanced CMOS Technology Nodes	6/25/2009
Advanced Nonlinear Device Characterization Utilizing Nonlinear Vector Network Analyzer and X-parameters with Arbitrary Load Dependence	6/24/2009
Solving DigRFv4 Debug Challenges	6/16/2009
New Scope Technology Accelerates FPGA Debug	6/11/2009
Virtual Probing with Real-time Oscilloscopes and Waveform Transformation and Simulation Software	5/28/2009
Taking LTE MIMO from Standards to Starbucks	4/30/2009
USB 3.0 Superspeed PHY Testing Challenges: Verify Your 5Gbps design to the Specification	4/15/2009
Electromagnetic Properties of Materials: Characterization at Microwave Frequencies and Beyond	4/8/2009
Ensuring Interoperability and Performance of Your DDR Memory Subsystem	4/7/2009
A True Differential Millimeter Wave System with Port Power Control	3/18/2009
MIMO RF Measurements: Choosing and Using Tools	1/22/2009
Solving High-Speed DDR SI and Probing Challenges	1/13/2009
Making Those Difficult Electronic Control Measurements	12/3/2008
Debugging and Integrating MIPI DigRF-enabled ICs in LTE and WiMAX Mobile Devices	10/28/2008
TDR, S-Parameters and Differential Measurements	10/14/2008
Simplifying Debug of Low-Speed Serial Buses with Oscilloscopes	10/1/2008
Logic Analyzer Basics	9/23/2008
RF Measurements for LTE	8/7/2008
Nonlinear Vector Network Analyzer Applications	7/16/2008
Hints for Getting the Most Out of Your Oscilloscope	6/12/2008
Tips to Debug Common DDR 1/2/3 Physical and Protocol Layer Issues	6/5/2008
Portable Impulse Response Models for Signal Integrity Applications	5/15/2008
Advanced Validation and Testing of PCIe 2.0	5/14/2008
Characterizing PLL Signal Transition Behaviors Such as Microphonic/Phase-Hits	4/23/2008
Advanced Oscilloscope Triggering for Design Verification and Debug	4/22/2008
New Noise Technology and Its Applications	4/17/2008
Improving the Odds of Catching the Predictable and Unpredictable with a Mixed-Signal Oscilloscope	3/27/2008
Characterizing Your PLL Design to Manage System Jitter	3/18/2008
Oscilloscope Bandwidth Requirements for Emerging Serial Data Interfaces	2/20/2008
Designing for Yield in Advanced RFICs: Tools for Success	1/30/2008
Simplifying Debug of Low-Speed Serial Systems with MSOs	1/22/2008
HSUPA Device Design: Find Issues Earlier, Resolve Issues Faster	1/15/2008
Novel Design Techniques for First Pass RF Board Design	1/10/2008
Simulation and Design of Software Defined Radios (SDR)	11/28/2007
Solving Advanced Parametric Challenges: Using Your Semiconductor Device Analyzer Effectively	10/24/2007
Optimizing System Performance: Using the Capabilities of New, Smart Instruments	9/26/2007
RF Board Design for Next Generation Wireless Systems	8/29/2007
Getting the Most Out of LXI and PXI	8/15/2007
Accelerate Debug of FPGA-based Systems Using MSOs	8/9/2007
RFID Overview and Signal Analysis	7/26/2007
Comparing LXI and PXI as Measurement Platforms	7/24/2007
USB 2.0 Compliance: How to Design and Test Your Products for Success	7/19/2007
Characterizing AM/PM Noise Components in Microwave Signal Sources	6/12/2007
Validating of DDR/II/III Memory Designs	5/30/2007
Practical Steps for FPGA System Debug, Validation, and Serial Link Tuning	5/17/2007
You've Measured the Jitter. Now How Do You Reduce It?	4/26/2007
True-Differential Measurements Using Network Analyzers	4/24/2007
Overcome Common Signal Generation Challenges	4/12/2007
Accurate Transient Simulations at Gigabit/s Data Rates	3/15/2007
MIMO Design and Verification Solutions for Mobile WiMax	2/7/2007
Demystifying PCI Express 1.1 for New Designs	1/24/2007
Embedded Debug	1/24/2007
Minimizing Crosstalk in High Speed Interconnects using Measurement-based Modeling	10/26/2006
Clock Jitter Analysis with Femto-Second Resolution	10/10/2006
RF Back to Basics: Signal Generation	6/28/2006
PCI Express Performance Measurements	6/27/2006
RF Back to Basics: Power Measurements	6/22/2006
Digital Demodulation and Troubleshooting Basics	6/21/2006
RF Back to Basics: Network Analysis	5/23/2006

News
Agilent Technologies Launches Versatile Benchtop Boundary Scan Analyzer for Electronic Test	2/19/2013
Agilent Technologies Collaborates with Thales to Apply X-parameters Technology to RF System Design	6/20/2012
Agilent Technologies Announces Shipment of 3-D EM-Simulation Platform	12/12/2011
Agilent Technologies Introduces Scope-Based JTAG Protocol Application	6/2/2010
Agilent Technologies Completes Acquisition of Keithley Instruments' RF Product Line	12/2/2009
Agilent Technologies' New Pattern Generator for Pulse Function Arbitrary Noise Generator Tests Analog, Digital, Mixed-Signal Devices	5/15/2009
Agilent Technologies, Symwave Collaboration Enables High-Quality USB 3.0 Devices	4/15/2009
Synopsys DesignWare IP for PCI Express Passes Agilent Technologies' Inline Error Injection Testing	3/9/2009
Agilent Technologies Offers Complete Jitter Tolerance Test for Next Generation of Forwarded-, Embedded-Clock Designs	2/3/2009
Agilent Technologies/ Quantum Data Solution Enables DisplayPort Test Automation	12/2/2008
Agilent Technologies Announces USB 3.0 SuperSpeed Physical Layer Compliance Test Application	11/25/2008
Agilent Technologies Introduces Device Analyzer with Curve Tracer Functionality for Power-Device Evaluation	11/5/2008
Agilent Technologies and The MathWorks Make MATLAB Software Available with Purchase of Agilent Signal, Spectrum Analyzers	9/24/2008
Agilent Technologies to Release Boundary Scan-VTEP Hybrid that Minimizes Obstacles to In-Circuit Test	2/15/2008
Agilent Technologies and Sequans to Work Together on Wave 2 Mobile WiMAX Protocol Test	10/22/2007
Agilent Technologies Announces Strategic Partnership with Mentor Graphics on Automotive Network Design, Test and Validation Tools	5/8/2007
Agilent Technologies Introduces FET Solid-State Switches	3/1/2007
Agilent Technologies and Xilinx Offer New High-Speed Serial I/O Link Test	1/29/2007
J-BERT Options Enable Fast and Accurate Characterization of High-Speed Computer Interfaces	1/18/2007
Agilent Technologies Introduces Digital Signal Analyzer Optimized for Serial-Data-Based Designs	12/4/2006
Agilent Technologies and FuturePlus Systems Introduce Analysis Tool for DDR3 Memory Designs	11/29/2006
Agilent Technologies Introduces Deepest Memory Logic Analyzer with New Applications	11/2/2006
Agilent Technologies Introduces LXI Class C Compliant Oscilloscope Family Optimized for Test-System Use	11/2/2006
Agilent Technologies' Newest ENA Series RF Network Analyzer Raises the Bar for RF Network Analyzers	10/2/2006
Agilent Technologies Acquires Remcom's 3D Electro-Magnetic Antenna Simulation Technology	9/13/2006
Agilent Introduces Advanced Fixed Configuration Logic Analyzers	5/31/2006
Agilent Technologies Ships Genesys 2006 RF and Microwave Design Software	5/15/2006
Agilent Technologies Reorganizes Electronic Measurements Group	5/3/2006
Agilent Technologies Offers High Performance ATE Solution for High-Speed Devices and Interfaces	4/25/2006
Agilent Technologies Introduces Next-Generation Parametric Test Software	3/6/2006
Agilent Technologies Becomes First Test & Measurement Manufacturer to Join ZigBee Alliance for Standards-Based Connectivity	10/26/2005
Agilent Technologies Adds S-Parameter Measurement Capability on DCA-J for Complete System Verification Solution	8/1/2005
Tensilica Signs Licensing Agreement with Agilent Technologies for Xtensa Processors in Imaging Applications	5/23/2005
Agilent Technologies' Signal Source Analyzer Speeds Test Time, Improves Accuracy, Lowers Cost	3/21/2005
Innovative Wireless Technologies Selects Agilent Technologies’ EDA Tools	10/18/2004
Agilent Technologies Implements 90nm Digital Signal Processor Using Cadence Encounter Digital IC Platform	3/5/2004
Real-Time Logic Debug Technology from Xilinx Could Slash FPGA Verification Times by Up to 50%	3/1/2004
Teseda and Agilent Technologies Certify First STIL Link between Engineering DFT and Production Test	2/18/2004

Go directly to Agilent Technologies, Inc. for more company and product information.